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NoisePro is the turnkey hardware and software solution for the characterization
and modeling of 1/f noise and thermal noise in advanced devices.
Noise is an unavoidable consequence of semiconductor technology.
Its impact on circuit performance is significant in today's low-voltage,
high performance, mixed signal, RF, deep submicron designs.
Therefore the ability to accurately characterize noise becomes a
fundamental requirement for design. Noise characterization is also
important for monitoring semiconductor process qualities.
The 9812B and NoisePro wafer-level, low frequency noise
characterization system provides as much as 100 times the productivity
and throughput improvement over conventional methods. It is capable of
measuring noise, monitoring the process quality and extracting flicker noise
model parameters for circuit simulation. NoisePro software provides
the noise modeling capabilities for MOSFETs, BJTs and other components.
In addition, the wafer level automatic flicker noise characterization
system makes it possible to monitor the gate oxide without destroying any
devices under test.
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