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PRODUCTS & SOLUTIONS - ADVANCED SPICE MODELING SOLUTIONS
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Low Frequency Noise Characterization and Modeling System - NoisePro™/9812B
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Adopted by over 100 customers worldwide as the industry's de-facto standard for over 10 years
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Accurate 1/f noise characterization for on-wafer or packaged semiconductor devices
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Efficient RTS noise characterization for on-wafer MOSFET devices
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Powerful auto measurement and analysis functions for process monitoring and noise modeling
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Target applications
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Gate oxide quality monitoring
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Low frequency noise modeling for high performance mixed-signal and RF circuit designs
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Process and device characteristics evaluation
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